Basics & Applications of Particle Characterizations
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Currently scheduled courses.
Basics & Applications of Particle Characterizations , .8 CEUs,
Remi Trottier & Stewart Wood, instructors
Basics and Applications of Particle Characterization – Learn to improve characterization and data interpretation skills for better particle separation, control of particulates, particulate formulation, suspensions, and dispersions.
Course Content
This course will be of interest to scientists and engineers who want to improve their characterization and data interpretation skills for better particle separation, control of particulates, particulate formulation, suspensions, and dispersions. Given the wide range of technologies available for particle size and shape characterization, selection of the best technology for a particular application is not a trivial task. This short course will cover the basics of particle size (from nanoscale to millimeters) characterization along with several commercially available technologies. Participants will acquire the knowledge necessary for proper instrument selection and data validation and interpretation.
The following topics will be covered:
- Basic concepts
- Data representation
- Number, Surface Area, Volume Distributions
- Averages
- Sampling
- Technologies & Data Interpretation
- Laser diffraction
- Sedimentation
- Image Analysis
- Dynamic Light Scattering
- Optical Particle Counting
- Electrozone Particle Counters
- Ultrasonic Spectroscopy
- Hydrodynamic Chromatography
About the instructors:
Remi Trottier has 15 years of experience in particle characterization. He is a senior specialist in the analytical laboratory at The Dow Chemical Company and is currently involved with several method development projects using various particle characterization technologies. Prior to joining Dow, Dr. Trottier supervised the physical measurements group within the Analytical Chemistry Division at the Alcoa Technical Center where he developed several particle sizing methods. He received his BSc. and MSc. from the department of Applied Physics at Laurentian University in Sudbury, Ontario, Canada and received his Ph.D. from the department of Chemical Engineering at Loughborough University of Technology in the UK.
Stewart Wood is a research chemist in the Analytical Sciences Laboratory at The Dow Chemical Company in Midland, Michigan. For the past 21 years, he has been involved with developing and implementing, on a global basis for Dow, particulate characterization technologies, such as hydrodynamic chromatography, laser Doppler anemometry, light obscuration, photosedimentometry, and dynamic image analysis. Some of his current work involves on-line and in-situ particle characterization for research and production facilities. Mr. Wood holds B.S. and M.S. degrees in chemistry from Clarkson University in Potsdam, N.Y.
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